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Installation Report
DVIA-P Series
10-07-2024

YIMO(Huahong) ASML E-beam Wafer inspection system eScan 460 DVIA-P4000 Installation Report

DVIA-P Series
Installation Report
YIMO
ASML
eScan 460
DVIA-P4000
240424R1

Vibration Isolation System Information

Model: DVIA-P4000

Serial Number: 240424R1

Engineer

Chaewon Lee from DAEIL SYSTEMS

Report written date: 2024-10-12

Tuning Date

2024-10-07

Installation Site

Huahong

Equipment

Manufacturer: ASML

Equipment: E-beam Wafer inspection system

Model: eScan 460

Equipment Status

The equipment was installed on the DVIA-P4000 platform. Operation

Number of Tuning Trial

2nd(1st: 24.09.12)

Measurement Device

8.1) Brüel & Kjær LAN-XI DAQ Type 3050

- Hardware: B&K Front End Type 3050-A-040

- Software: B&K Pulse Labshop 22 Version

8.2) Accelerometer

- PCB Accelerometer

- Model: 393B05

Measurement Setup

Bandwidth: 200 Hz

Lines: 800

Averaging: Spectrum Averaging

Engineering Units: m/s

Window: Hanning

Overlap: Max

Vibration Specification

VC-D

Conclusion

After the installation of the DVIA-P4000, floor vibration was reduced to within the vibration specification in all axes.

Measurement Summary

Measurement PointStatusAxisVibration SpecificationMeasurement DataResult
FAB
1. Floor
2. DVIA-P4000
Equipment is installed and operation.Vertical6.25E-06 m/s
(VC-D)
VC-F
@ 20 Hz
PASS
Left to Right6.25E-06 m/s
(VC-D)
VC-F
@ 2 Hz
PASS
Front to Back6.25E-06 m/s
(VC-D)
VC-F
@ 2 Hz
PASS

Data and Image

Vertical VC Curves

Left to Right VC Curves

Front to Back VC Curves

Reference

Generic Vibration Criteria

Criterion CurveDescriptionAmplitude
μm/s (µin/s)
Detail Size
μm
Workshop (ISO)Distinctly perceptible vibration. Appropriate to workshops and non-sensitive areas.800 (32,000)N/A
Office (ISO)Perceptible vibration. Appropriate to offices and non-sensitive areas.400 (16,000)N/A
Residential Area (ISO)Barely perceptible vibration. Appropriate to sleep areas in most instances.200 (8,000)75
Operating Theatre (ISO)Vibration not perceptible. Suitable for surgical suites, microscopes to 100x.100 (4,000)25
VC-AAdequate for optical microscopes to 400x, microbalances, optical balances.50 (2,000)8
VC-BAppropriate for inspection and lithography equipment to 3μm line widths.25 (1,000)3
VC-CAppropriate for optical microscopes to 1000x, lithography equipment to 1μm.12.5 (500)1 - 3
VC-DSuitable for demanding equipment including electron microscopes (SEMs/TEMs).6.25 (250)0.1 - 0.3
VC-EFor the most demanding systems including E-Beam lithography at nanometer scales.3.12 (125)< 0.1
VC-FFor extremely quiet research spaces. Not recommended as design criterion.1.56 (62.5)N/A
VC-GFor extremely quiet research spaces. Not recommended as design criterion.0.78 (31.25)N/A

Notes:

- As measured in one-third octave bands over 8-80 Hz (VC-A/B) or 1-80 Hz (VC-C through VC-G).

- Detail size refers to width in microelectronics fabrication or particle size in medical research.

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Case Study Information

Category
Installation Report
SeriesDVIA-P Series
Date10-07-2024
Tags
DVIA-P Series
Installation Report
YIMO
ASML
eScan 460
DVIA-P4000
240424R1