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Installation Report
DVIA-M Series
07-12-2022

Zeiss Gemini SEM360 DVIA-ML1000 Installation Report (220307R1)

DVIA-M Series
Installation Report
Universal Scientific Industrial
USI
Zeiss
Gemini SEM360
SEM
Shanghai
DVIA-ML1000
DVIA-M1000
220307R1

Target equipment

Zeiss Gemini SEM360

Place of installation

Shanghai

Remark

Good Performance

End user

Universal Scientific Industrial Co., Ltd.(环旭电子)

Reporting

Operator: Cheon, Seoung hoon

Date of setup: 22.07.11

Date of reporting: 22.07.12

Date of business trip

17.12.27~17.12.29

Overview

The DVIA-M1000 active vibration isolation platform is appropriately installed and functioning as intended.

Measurement date

2022.07.11 (Monday)

Operator

DAEIL SYSTEMS, Seounghoon Cheon, Youngha Lee

Place of measurement

Shanghai

Equipment Model

Zeiss Gemini SEM360

Measurement conditions and results

Summary of measurement results

Test ConditionZXY
FloorABB
Above ActiveFEF

Good omnidirectional performance.

MB1000 internal program performance measurement result

Vertical VC Curves

Left to Right VC Curves

Front to Back VC Curves

Octave Band Result

Vertical octave band result

Left to Right octave band result

Front to Back octave band result

Reference

Generic Vibration Criteria

Criterion CurveDescriptionAmplitude
μm/s (µin/s)
Detail Size
μm
Workshop (ISO)Distinctly perceptible vibration. Appropriate to workshops and non-sensitive areas.800 (32,000)N/A
Office (ISO)Perceptible vibration. Appropriate to offices and non-sensitive areas.400 (16,000)N/A
Residential Area (ISO)Barely perceptible vibration. Appropriate to sleep areas in most instances.200 (8,000)75
Operating Theatre (ISO)Vibration not perceptible. Suitable for surgical suites, microscopes to 100x.100 (4,000)25
VC-AAdequate for optical microscopes to 400x, microbalances, optical balances.50 (2,000)8
VC-BAppropriate for inspection and lithography equipment to 3μm line widths.25 (1,000)3
VC-CAppropriate for optical microscopes to 1000x, lithography equipment to 1μm.12.5 (500)1 - 3
VC-DSuitable for demanding equipment including electron microscopes (SEMs/TEMs).6.25 (250)0.1 - 0.3
VC-EFor the most demanding systems including E-Beam lithography at nanometer scales.3.12 (125)< 0.1
VC-FFor extremely quiet research spaces. Not recommended as design criterion.1.56 (62.5)N/A
VC-GFor extremely quiet research spaces. Not recommended as design criterion.0.78 (31.25)N/A

Notes:

- As measured in one-third octave bands over 8-80 Hz (VC-A/B) or 1-80 Hz (VC-C through VC-G).

- Detail size refers to width in microelectronics fabrication or particle size in medical research.

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Case Study Information

Category
Installation Report
SeriesDVIA-M Series
Date07-12-2022
Tags
DVIA-M Series
Installation Report
Universal Scientific Industrial
USI
Zeiss
Gemini SEM360
SEM
Shanghai
DVIA-ML1000
DVIA-M1000
220307R1