Tier-1 Semiconductor Fabrication Facility DSR C Tower 3F Research Lab ZEISS GeminiSEM 460 DVIA-ULF1000 Installation Report
Contents
Overview
Tuning and vibration measurements were completed for the DVIA-ULF1000 installed at Tier-1 Semiconductor Fabrication Facility DSR C Tower, 3rd floor research laboratory.
Tuning and vibration measurements were performed with the equipment Turned on/IDLE.
Measurement data are presented as VC curves, with reference material for vibration level criteria.
Vibration Isolation System Information
Model: DVIA-ULF1000
Serial Number: 251112R4
Engineer
Chaewon Lee, Field Engineer, DAEIL SYSTEMS
Measurement Date
January 8, 2026
Measuring Location
Tier-1 Semiconductor Fabrication Facility DSR C Tower, 3rd floor research laboratory
End User
Tier-1 Semiconductor Fabrication Facility
Equipment Information
Manufacturer: ZEISS
Equipment: FE-SEM
Model: GeminiSEM 460
Equipment specification
Equipment Status
장비 설치 및 Turned on/IDLE
Measuring Equipment
Data Physics DAQ
Hardware: QUATTRO, Serial Number: 22436
Software: SignalCalc ACE
Accelerometer
PCB Accelerometer
Model: 393B05
Measuring Set-up
F Span: 200 Hz
Lines: 3200
Engineering Units: m/s
Window: Hanning
Averaging: FFT Spectrum Averaging
Averaging mode: Exponential, 40
Conclusion
Vibration specifications are satisfied in all directions.
Measurement Data
| Measuring Point | Status | Direction | Floor | DVIA-ULF1000 | Floor | DVIA-ULF1000 |
|---|---|---|---|---|---|---|
| Tier-1 Semiconductor Fabrication Facility DSR C Tower 3F Research Lab 1. Floor vibration 2. DVIA-ULF1000 | Turned on/IDLE | Vertical | VC-B @ 10 Hz | VC-G @ 10 Hz | ✗ FAIL | ✓ PASS |
| Left to Right | VC-D @ 8 Hz | VC-F @ 8 Hz | ✓ PASS | ✓ PASS | ||
| Front to Back | VC-E @ 16 Hz | VC-F @ 16 Hz | ✓ PASS | ✓ PASS |
Data and Image
Vertical VC Curves
Vertical Autospectrum
Vertical Transmissibility
Left to Right VC Curves
Left to Right Autospectrum
Left to Right Transmissibility
Front to Back VC Curves
Front to Back Autospectrum
Front to Back Transmissibility
Reference
Generic Vibration Criteria
Notes:
1. VC-A/B is measured in 1/3 octave bands from 8-80 Hz, VC-C through VC-G from 1-80 Hz.
2. Detail size refers to line widths in microelectronics manufacturing or particle sizes in medical research.
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