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Installation Report
DVIA-ML Series
08-18-2025

Tier-1 Semiconductor DSR ZEISS Versa 630 X-ray Microscope DVIA-ML3000 (250625R2) Installation Report

DVIA-ML Series
Installation Report
ZEISS
Versa 630
X-ray Microscope
DVIA-ML3000

Overview

Tuning and vibration measurement were performed on the DVIA-ML3000 installed at Tier-1 Semiconductor DSR A Tower 5F analysis laboratory.

With 장비 Turned on/IDLE, tuning and vibration measurement were conducted.

Data are presented as VC curves with reference information on vibration levels.

Vibration Isolation System Information

Model: DVIA-ML3000

Serial Number: 250625R2

Engineer

Chaewon Lee — DAEIL SYSTEMS

Tuning Date

August 6, 2025

Report Written Date

August 18, 2025

Installation Site

Tier-1 Semiconductor DSR A Tower 5F analysis laboratory

End User

Tier-1 Semiconductor

Equipment Condition

장비 Turned on/IDLE

Equipment

Manufacturer: ZEISS

Equipment: X-ray Microscope

Model: Versa 630

Measuring Equipment

9.1) Data Physics DAQ

Hardware: QUATTRO, Serial Number: 22436

Software: SignalCalc ACE

9.2) Accelerometer

PCB Accelerometer

Model: 393B05

Measurement Setup

F Span: 200 Hz

Lines: 3200

Engineering Units: m/s

Window: Hanning

Averaging: FFT Spectrum Averaging

Averaging mode: Exponential, 40

Equipment Vibration Specification

Conclusion

The vibration specification is satisfied in all directions.

Measurement Data

Measurement siteStatusSpecificationAxisMeasurement dataResult
FloorDVIA-ML3000FloorDVIA-ML3000
Tier-1 Semiconductor DSR A Tower 5F analysis laboratory
1. Floor vibration
2. DVIA-ML3000
장비 Turned on/IDLEVC-CVerticalVC-C
@ 63 Hz
VC-G
@ 63 Hz
PASSPASS
Left to RightVC-D
@ 63 Hz
VC-G
@ 63 Hz
PASSPASS
Front to BackVC-C
@ 25 Hz
VC-E
@ 25 Hz
PASSPASS

Data and Image

Vertical VC Curves

Vertical Autospectrum

Vertical Transmissibility

Left to Right VC Curves

Left to Right Autospectrum

Left to Right Transmissibility

Front to Back VC Curves

Front to Back Autospectrum

Front to Back Transmissibility

Reference

Generic Vibration Criteria

Criterion CurveDescriptionAmplitude
μm/s (µin/s)
Detail Size
μm
Workshop (ISO)Distinctly perceptible vibration. Appropriate to workshops and non-sensitive areas.800 (32,000)N/A
Office (ISO)Perceptible vibration. Appropriate to offices and non-sensitive areas.400 (16,000)N/A
Residential Area (ISO)Barely perceptible vibration. Appropriate to sleep areas in most instances.200 (8,000)75
Operating Theatre (ISO)Vibration not perceptible. Suitable for surgical suites, microscopes to 100x.100 (4,000)25
VC-AAdequate for optical microscopes to 400x, microbalances, optical balances.50 (2,000)8
VC-BAppropriate for inspection and lithography equipment to 3μm line widths.25 (1,000)3
VC-CAppropriate for optical microscopes to 1000x, lithography equipment to 1μm.12.5 (500)1 - 3
VC-DSuitable for demanding equipment including electron microscopes (SEMs/TEMs).6.25 (250)0.1 - 0.3
VC-EFor the most demanding systems including E-Beam lithography at nanometer scales.3.12 (125)< 0.1
VC-FFor extremely quiet research spaces. Not recommended as design criterion.1.56 (62.5)N/A
VC-GFor extremely quiet research spaces. Not recommended as design criterion.0.78 (31.25)N/A

*Notes:*

- As measured in one-third octave bands over 8-80 Hz (VC-A/B) or 1-80 Hz (VC-C through VC-G).

- Detail size refers to width in microelectronics fabrication or particle size in medical research.

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Case Study Information

Category
Installation Report
SeriesDVIA-ML Series
Date08-18-2025
Tags
DVIA-ML Series
Installation Report
ZEISS
Versa 630
X-ray Microscope
DVIA-ML3000