Skip to main content
Installation Report
DVIA-ULF Series
09-14-2022

New National Metrology Centre GBI DVIA-UB700 (220209R02) Installation Report

DVIA-ULF Series
Installation Report
New National Metrology Centre
Singapore
DVIA-UB700
220209R02
GBI

Prepared for

New National Metrology Centre

Prepared by

Engineer: Seounghoon Cheon

Tuning date: 22.09.06

Report written date: 22.09.14

Date of business trip : 17.12.27~17.12.29

Overview

The DVIA-UB700 active vibration isolation platform is appropriately installed and functioning as intended.

System Information

Model: DVIA-UB700

Serial Number: 220209R02

Engineer

Seounghoon Cheon, from DAEIL SYSTEMS

Tuning Date

September 06, 2022

Location

2 Fusionopolis Way, Singapore

Equipment

GBI system/ 600kg

Data and Image

Z-axis (Vertical) Transmissibility

X-axis (Left to Right) Transmissibility

Y-axis (Front to Back) Transmissibility

Reference

Criterion CurveDescriptionAmplitude
μm/s (µin/s)
Detail Size
μm
Workshop (ISO)Distinctly perceptible vibration. Appropriate to workshops and non-sensitive areas.800 (32,000)N/A
Office (ISO)Perceptible vibration. Appropriate to offices and non-sensitive areas.400 (16,000)N/A
Residential Area (ISO)Barely perceptible vibration. Appropriate to sleep areas in most instances.200 (8,000)75
Operating Theatre (ISO)Vibration not perceptible. Suitable for surgical suites, microscopes to 100x.100 (4,000)25
VC-AAdequate for optical microscopes to 400x, microbalances, optical balances.50 (2,000)8
VC-BAppropriate for inspection and lithography equipment to 3μm line widths.25 (1,000)3
VC-CAppropriate for optical microscopes to 1000x, lithography equipment to 1μm.12.5 (500)1 - 3
VC-DSuitable for demanding equipment including electron microscopes (SEMs/TEMs).6.25 (250)0.1 - 0.3
VC-EFor the most demanding systems including E-Beam lithography at nanometer scales.3.12 (125)< 0.1
VC-FFor extremely quiet research spaces. Not recommended as design criterion.1.56 (62.5)N/A
VC-GFor extremely quiet research spaces. Not recommended as design criterion.0.78 (31.25)N/A

Notes:

1. VC-A/B is measured in 1/3 octave bands from 8-80 Hz, VC-C through VC-G from 1-80 Hz.

2. Detail size refers to line widths in microelectronics manufacturing or particle sizes in medical research.

Share this Case Study

Case Study Information

Category
Installation Report
SeriesDVIA-ULF Series
Date09-14-2022
Tags
DVIA-ULF Series
Installation Report
New National Metrology Centre
Singapore
DVIA-UB700
220209R02
GBI