Skip to main content
Installation Report
DVIA-M Series
03-09-2023

YIMO JEOL JEM 1400 Flash DVIA-M1000 (220126R7-3) Installation Report — Sun Yat-Sen University

DVIA-M Series
Installation Report
YIMO
JEOL
TEM
JEM 1400 Flash
DVIA-M1000
220126R7-3
Sun Yat-Sen University

Overview

The DVIA-M1000 active vibration isolation platform is appropriately installed and functioning as intended.

Vibration Isolation System Information

Model: DVIA-M1000

Serial Number: 220126R7-3

Engineer

Youngha Lee DAEIL SYSTEMS

Tuning Date

March 09, 2023

Report written date

23.05.22

End User

SUN YAT-SEN UNIVERSITY

Number of Tuning Trial

1st

Location

Guangdong, China

Equipment

Manufacturer: JEOL

Equipment: TEM

Model: JEM 1400 Flash

Equipment Condition

The equipment is installed/Turned off

Data and Image

Vertical VC Curves

Left to Right VC Curves

Front to Back Transmissibility

Equipment picture

13. Reference

Generic Vibration Criteria

Criterion CurveDescriptionAmplitude
μm/s (µin/s)
Detail Size
μm
Workshop (ISO)Distinctly perceptible vibration. Appropriate to workshops and non-sensitive areas.800 (32,000)N/A
Office (ISO)Perceptible vibration. Appropriate to offices and non-sensitive areas.400 (16,000)N/A
Residential Area (ISO)Barely perceptible vibration. Appropriate to sleep areas in most instances.200 (8,000)75
Operating Theatre (ISO)Vibration not perceptible. Suitable for surgical suites, microscopes to 100x.100 (4,000)25
VC-AAdequate for optical microscopes to 400x, microbalances, optical balances.50 (2,000)8
VC-BAppropriate for inspection and lithography equipment to 3μm line widths.25 (1,000)3
VC-CAppropriate for optical microscopes to 1000x, lithography equipment to 1μm.12.5 (500)1 - 3
VC-DSuitable for demanding equipment including electron microscopes (SEMs/TEMs).6.25 (250)0.1 - 0.3
VC-EFor the most demanding systems including E-Beam lithography at nanometer scales.3.12 (125)< 0.1
VC-FFor extremely quiet research spaces. Not recommended as design criterion.1.56 (62.5)N/A
VC-GFor extremely quiet research spaces. Not recommended as design criterion.0.78 (31.25)N/A

Notes:

1. As measured in one-third octave bands over 8-80 Hz (VC-A/B) or 1-80 Hz (VC-C through VC-G).

2. Detail size refers to width in microelectronics fabrication or particle size in medical research.

Share this Case Study

Case Study Information

Category
Installation Report
SeriesDVIA-M Series
Date03-09-2023
Tags
DVIA-M Series
Installation Report
YIMO
JEOL
TEM
JEM 1400 Flash
DVIA-M1000
220126R7-3
Sun Yat-Sen University