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Installation Report
DVIA-P Series
05-20-2026

Tier-1 Semiconductor Giheung K2 S1 Tokyo Electron Precio XL DVIA-P4000 Installation Report

DVIA-P Series
Installation Report
Tier-1 Semiconductor
Tokyo Electron
Precio XL

Overview

Tuning and vibration measurement were performed on the DVIA-PB4000 installed at Tier-1 Semiconductor Giheung site K2 S1 line 2nd floor.

Tuning and vibration measurement were conducted to verify normal operation of the vibration isolation platform before equipment installation.

Data are presented as VC Curves, along with reference materials for vibration level assessment.

Vibration Isolation System Information

Model: DVIA-P4000

Serial Number: 251204R2

Engineer

Chaewon Lee from DAEIL SYSTEMS

Tuning Date

February 26, 2026

Installation Site

Tier-1 Semiconductor Giheung site K2 S1 line 2nd floor

End User

Tier-1 Semiconductor

Customer Equipment

Manufacturer: Tokyo Electron

Equipment: Wafer Prober

Model: Precio XL

Equipment Specifications

VC-E

Equipment Status

Equipment not installed

Measuring Equipment

Data Physics DAQ

Hardware: QUATTRO, Serial Number: 22436

Software: SignalCalc ACE

Accelerometer

PCB Accelerometer

Model: 393B05

Measuring Set-up

F Span: 200 Hz

Lines: 3200

Engineering Units: m/s

Window: Hanning

Averaging: FFT Spectrum Averaging

Averaging mode: Exponential, 40

Vibration Isolation System Checklist

All inspection items met the acceptance criteria and the final result is Pass.

No.Inspection ItemAcceptance CriteriaResult
13.1Displacement Sensor SettingZ: 1.0 mm / X, Y: 3.0mmPASS
13.2Float Height2.5 mmPASS
13.3Servo Valve Output1.0 V – 8.0VPASS

Displacement Sensor Setting

Float Height

Servo Valve Output

Conclusion

With the equipment not yet installed, tuning and vibration measurement were performed to verify normal operation of the vibration isolation platform. For the DVIA-PB4000 model, designed isolation performance is not fully expressed when no equipment is mounted on top.

Tuning and measurement showed frequency bands in some directions that exceeded the vibration specification; this behavior occurs when no equipment is mounted. After the equipment is installed and re-tuning is performed under normal conditions, the vibration specification is expected to be met across all directions and frequency bands.

The objective of this inspection was to confirm the isolator drive condition and normal operation; no abnormality was found with the isolator itself.

Measurement Data

Measuring PointStatusDirectionSpecMeasurement DataResult
FloorDVIA-PB4000FloorDVIA-PB4000
Tier-1 Semiconductor Giheung site
K2 S1 line 2nd floor
1. Floor vibration
2. DVIA-PB4000
Equipment not installedVerticalVC-EVC-B
@ 12.5 Hz
VC-E
@ 12.5 Hz
FAILPASS
Left to RightVC-EVC-D
@ 20 Hz
VC-C
@ 20 Hz
FAILFAIL
Front to BackVC-EVC-D
@ 12.5 Hz
VC-E
@ 12.5 Hz
FAILPASS

Data and Image

Vertical VC Curves

Vertical Autospectrum

Vertical Transmissibility

Left to Right VC Curves

Left to Right Autospectrum

Left to Right Transmissibility

Front to Back VC Curves

Front to Back Autospecturm

Front to Back Transmissibility

Reference

Generic Vibration Criteria

Criterion CurveDescriptionAmplitude
μm/s (µin/s)
Detail Size
μm
Workshop (ISO)Distinctly perceptible vibration. Appropriate to workshops and non-sensitive areas.800 (32,000)N/A
Office (ISO)Perceptible vibration. Appropriate to offices and non-sensitive areas.400 (16,000)N/A
Residential Area (ISO)Barely perceptible vibration. Appropriate to sleep areas in most instances.200 (8,000)75
Operating Theatre (ISO)Vibration not perceptible. Suitable for surgical suites, microscopes to 100x.100 (4,000)25
VC-AAdequate for optical microscopes to 400x, microbalances, optical balances.50 (2,000)8
VC-BAppropriate for inspection and lithography equipment to 3μm line widths.25 (1,000)3
VC-CAppropriate for optical microscopes to 1000x, lithography equipment to 1μm.12.5 (500)1 - 3
VC-DSuitable for demanding equipment including electron microscopes (SEMs/TEMs).6.25 (250)0.1 - 0.3
VC-EFor the most demanding systems including E-Beam lithography at nanometer scales.3.12 (125)< 0.1
VC-FFor extremely quiet research spaces. Not recommended as design criterion.1.56 (62.5)N/A
VC-GFor extremely quiet research spaces. Not recommended as design criterion.0.78 (31.25)N/A

Notes:

1. VC-A/B is measured in 1/3 octave bands from 8-80 Hz, VC-C through VC-G from 1-80 Hz.

2. Detail size refers to line widths in microelectronics manufacturing or particle sizes in medical research.

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Case Study Information

Category
Installation Report
SeriesDVIA-P Series
Date05-20-2026
Tags
DVIA-P Series
Installation Report
Tier-1 Semiconductor
Tokyo Electron
Precio XL