Skip to main content
Installation Report
DVIA-P Series
09-21-2025

Tier-1 Semiconductor Hwaseong NRD Line 8F Bruker NM-VI DVIA-P4000 (036174) Installation Report

DVIA-P Series
Installation Report
Tier-1 Semiconductor
Bruker
NM-VI
Photomask Repair System

Overview

Tuning and inspection were performed on the DVIA-P4000 installed at Tier-1 Semiconductor Hwaseong site NRD Line 8F.

After air supply, the isolation table began to float automatically even though no float-up command was issued.

This report was prepared based on performance comparison with the inspection report dated December 14, 2023.

Tuning and vibration measurement were conducted with the equipment installed and in IDLE.

Data are presented as VC curves with reference material on vibration levels.

Vibration Isolation System Information

Model: DVIA-P4000

Serial Number (SAC-07): 036174

Engineer

Chaewon Lee from DAEIL SYSTEMS

Measurement Date

September 18, 2025

Installation Site

Tier-1 Semiconductor Hwaseong site NRD Line 8F

End User

Tier-1 Semiconductor

Equipment Information

Manufacturer: Bruker

Equipment: Photomask Repair System

Model: NM-VI

Equipment Specifications

VC-D

Equipment Status

장비 설치 및 IDLE

Measuring Equipment

Data Physics DAQ

Hardware: QUATTRO, Serial Number: 22436

Software: SignalCalc ACE

Accelerometer

PCB Accelerometer

Model: 393B05

Measuring Set-up

F Span: 200 Hz

Lines: 3200

Engineering Units: m/s

Window: Hanning

Averaging: FFT Spectrum Averaging

Averaging mode: Exponential, 40

Conclusion

On Unit 4, unnecessary air supply through the Air Out port caused four isolation units to float simultaneously. Detailed root causes such as air line kinks could not be fully determined on site under the conditions, but after corrective action the phenomenon did not recur. Air and POS alarm indicators on the isolation controller were cleared.

The inspection confirmed normal isolation performance. Performance issues reported during the December 14, 2023 visit were resolved. Vibration specifications were met in all directions.

Measurement Data

Measuring PointStatusDirectionSpecMeasurement DataResult
FloorDVIA-P4000FloorDVIA-P4000
Tier-1 Semiconductor Hwaseong site
NRD Line 8F
1. Floor vibration
2. DVIA-P4000
장비 설치/
IDLE
VerticalVC-DVC-C
@ 63 Hz
VC-F
@ 63 Hz
FAILPASS
Left to RightVC-B
@ 63 Hz
VC-G
@ 63 Hz
FAILPASS
Front to BackVC-B
@ 50 Hz
VC-F
@ 50 Hz
FAILPASS

Data and Image

Vertical VC Curves

Vertical VC Curves (23.12.14)

The elevated isolator-top vibration relative to floor vibration in the 1–40 Hz band observed during the December 14, 2023 inspection has been resolved. Vibration specifications are now met across all bands.

Vertical Autospectrum

Vertical Transmissibility

Left to Right VC Curves

Left to Right VC Curves (23.12.14)

The elevated isolator-top vibration relative to floor vibration in the 1–50 Hz band observed during the December 14, 2023 inspection has been resolved. Vibration specifications are now met across all bands.

Left to Right Autospectrum

Left to Right Transmissibility

Front to Back VC Curves

Front to Back VC Curves (23.12.14)

The elevated isolator-top vibration relative to floor vibration in the 1–40 Hz band observed during the December 14, 2023 inspection has been resolved. Vibration specifications are now met across all bands.

Front to Back Autospectrum

Front to Back Transmissibility

Reference

Generic Vibration Criteria

Criterion CurveDescriptionAmplitude
μm/s (µin/s)
Detail Size
μm
Workshop (ISO)Distinctly perceptible vibration. Appropriate to workshops and non-sensitive areas.800 (32,000)N/A
Office (ISO)Perceptible vibration. Appropriate to offices and non-sensitive areas.400 (16,000)N/A
Residential Area (ISO)Barely perceptible vibration. Appropriate to sleep areas in most instances.200 (8,000)75
Operating Theatre (ISO)Vibration not perceptible. Suitable for surgical suites, microscopes to 100x.100 (4,000)25
VC-AAdequate for optical microscopes to 400x, microbalances, optical balances.50 (2,000)8
VC-BAppropriate for inspection and lithography equipment to 3μm line widths.25 (1,000)3
VC-CAppropriate for optical microscopes to 1000x, lithography equipment to 1μm.12.5 (500)1 - 3
VC-DSuitable for demanding equipment including electron microscopes (SEMs/TEMs).6.25 (250)0.1 - 0.3
VC-EFor the most demanding systems including E-Beam lithography at nanometer scales.3.12 (125)< 0.1
VC-FFor extremely quiet research spaces. Not recommended as design criterion.1.56 (62.5)N/A
VC-GFor extremely quiet research spaces. Not recommended as design criterion.0.78 (31.25)N/A

Notes:

1. VC-A/B is measured in 1/3 octave bands from 8-80 Hz, VC-C through VC-G from 1-80 Hz.

2. Detail size refers to line widths in microelectronics manufacturing or particle sizes in medical research.

Share this Case Study

Case Study Information

Category
Installation Report
SeriesDVIA-P Series
Date09-21-2025
Tags
DVIA-P Series
Installation Report
Tier-1 Semiconductor
Bruker
NM-VI
Photomask Repair System